Prof. Vishal Gupta
Defect and Fault Tolerance Group, Department of Electronic Engineering, University of Rome “Tor Vergata”, Roma, Italy

Biography:

Vishal Gupta is currently a postdoctoral researcher at the University of Rome “Tor Vergata”, Italy, where he has been associated with the defect and fault tolerance group in the Department of Electronic Engineering. He has completed his PhD in 2021 from the same university. He is the winner of a "Research Fellowship" by the Italian Ministry of University and Research (MIUR). He is also the recipient of "Teaching Assistantship" by the Ministry of Education (MoE), Government of India and "Young Scientist Fellowship Award" by the M.P. Council of Science & Technology (MPCST), Government of M.P., India. He has also published various articles in Scopus and web of science indexed peer-reviewed journals and international conferences, including a "Best Paper Award" at the IEEE DTIS 2019 Conference, Mykonos, Greece. He is serving as a Guest Editor in the Special Issue of "Crystals" Journal (MDPI) and as a reviewer for several journals and also serves as a TPC member for highly cited conferences. He is also a member of the Indian Science Congress Association (ISCA), IEEE, and HiPEAC, as well as several other technical societies. His principal research interests include emerging computing paradigms; design issues in nanotechnology; VLSI Design and Design for Testability; Fault-Tolerant Design techniques; Manufacturing Defects and Process Variation.